Realisation of
a phase-locked loop for a dynamic mode scanning force
microscope with a tuning fork sensor. |
|
P. Vorburger, J.
Rychen, T. Vancura, T. Ihn, K. Ensslin, Solid State Physics
Laboratory, ETH Zurich, Switzerland D. Müller, Nanosurf
AG, Switzerland |
|
The instrument
set-up consists of a vacuum AFM system which uses a quartz
tuning fork with a resonance frequency of typically 32 kHz as
a force sensor. An etched tungsten tip is glued to the
vibrating end of the quartz. The frequency of the quartz is
measured with a high resolution (5mHz) and high stability
(3mHz/°C) phase-locked loop (PLL) manufactured by Nanosurf.
The electronics has been modified so that it is not only
capable of measuring the resonance frequency of the quartz
with high precision but it also excites the quartz tuning
fork. Consequently, the frequency of the excitation voltage
which drives the tuning fork can be controlled so that the
tuning fork oscillates at a fixed phase shift. To achieve that
optimum phase condition, a phase shifter is added and the
internal propotional controller of the PLL circuit is enhanced
by an integrator circuit. |
|
AFM measurements
have been successfully carried out using the system described
above. Due to the high stability of the PLL it was possible to
measure each frequency/distance curve over a relatively long
time period (up to several minutes). |
|
Measurements and
pictures by P. Vorburger, T. Ihn, K. Ensslin,
Laboratorium für Festkörperphysik, ETH Zürich, Switzerland,
e-mail: ihn@solid.phys.ethz.ch
http://www.nanophys.ethz.ch/ | |